Title :
Low-frequency capacitance measurements
Author :
Muzii, L. ; Piccialli, A. ; Ravarino, S.
Author_Institution :
UniversitÃ\xa0 dell´Aquila, Istituo di Fisica, Aquila, Italy
Abstract :
The letter proposes a technique for the fast determination at extremely low frequencies of the capacitance and leakage components of capacitors. The proposed method permits the measurement of C and G in only a few cycles. An apparatus is described employing this technique for the automatic measurement of m.o.s. capacitance as a function of frequency and bias voltage.
Keywords :
capacitance measurement; leakage currents; loss measurement; metal-insulator-semiconductor structures; MOS capacitance; automatic measurement; capacitors; leakage components; low frequency capacitance measurements;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19750377
