• DocumentCode
    930017
  • Title

    Restructuring and logic minimization for testable PLA

  • Author

    Hwang, Gwo-Haur ; Shen, Wen-Zen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    12
  • Issue
    4
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    488
  • Lastpage
    496
  • Abstract
    The untestability cube-number product (UCP), a testability measure that can accurately indicate the extra logic needed in testable programmable logic arrays (PLAs), is discussed. Two UCP-based PLA synthesis algorithms are developed. The first one is a restructuring algorithm named REST, and the other is a logic minimizer for testable PLA named LMTPLA. REST can make the restructured PLA testable by taking less extra hardware. LMTPLA is based on EXPRESSO-II and REST. It can consider the testability at the logic minimization process. In order to minimize UCP as well as the number of product terms, four strategies are developed: deleting the cubes with poor testability and reserving the cubes with good testability; giving up the primes, if necessary: partitioning the more untestable cubes into smaller cubes; and deleting the procedures which are useless in LMTPLA. REST and LMTPLA have been implemented on SUN4/260 in C language. For 40 benchmark circuits, the hardware overheads required are reduced by about 30-40%
  • Keywords
    circuit CAD; logic CAD; logic arrays; logic testing; minimisation of switching nets; C language; EXPRESSO-II; LMTPLA; PLA synthesis algorithms; REST; SUN4/260; logic minimization; programmable logic arrays; restructuring algorithm; testability measure; testable PLA; untestability cube-number product; Circuit faults; Circuit testing; Decoding; Hardware; Logic arrays; Logic design; Logic testing; Minimization; Programmable logic arrays; Shift registers;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.229732
  • Filename
    229732