• DocumentCode
    930162
  • Title

    Computation of drain and substrate currents in ultra-short-channel nMOSFET´s using the hydrodynamic model

  • Author

    Rahmat, Khalid ; White, Jacob ; Antoniadis, Dimitri A.

  • Author_Institution
    MIT, Cambridge, MA, USA
  • Volume
    12
  • Issue
    6
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    817
  • Lastpage
    824
  • Abstract
    The authors develop a robust and efficient numerical solution of the hydrodynamic model, which solves the energy balance equation, and compare predictions of this model, using one set of parameters, with experimental nMOSFET characteristics for a range of channel lengths down to ultrashort channels. The substrate current is calculated by direct integration of the energy distribution function, which uses the computed temperature to obtain the number of high energy electrons. The drain current calculated using this method is accurate for a range of channel lengths and biases, and correctly predicts the observed enhanced transconductance for ultrashort-channel devices. The substrate current matches the experimental data for a range of channel lengths and biases above threshold with one set of physically reasonable parameters
  • Keywords
    electric current; insulated gate field effect transistors; semiconductor device models; channel lengths; drain current; energy balance equation; energy distribution function; high energy electrons; hydrodynamic model; nMOSFET; substrate currents; transconductance; ultra-short-channel; ultrashort channels; Distributed computing; Distribution functions; Electrons; Equations; Hydrodynamics; MOSFET circuits; Predictive models; Robustness; Temperature distribution; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.229756
  • Filename
    229756