DocumentCode
930162
Title
Computation of drain and substrate currents in ultra-short-channel nMOSFET´s using the hydrodynamic model
Author
Rahmat, Khalid ; White, Jacob ; Antoniadis, Dimitri A.
Author_Institution
MIT, Cambridge, MA, USA
Volume
12
Issue
6
fYear
1993
fDate
6/1/1993 12:00:00 AM
Firstpage
817
Lastpage
824
Abstract
The authors develop a robust and efficient numerical solution of the hydrodynamic model, which solves the energy balance equation, and compare predictions of this model, using one set of parameters, with experimental nMOSFET characteristics for a range of channel lengths down to ultrashort channels. The substrate current is calculated by direct integration of the energy distribution function, which uses the computed temperature to obtain the number of high energy electrons. The drain current calculated using this method is accurate for a range of channel lengths and biases, and correctly predicts the observed enhanced transconductance for ultrashort-channel devices. The substrate current matches the experimental data for a range of channel lengths and biases above threshold with one set of physically reasonable parameters
Keywords
electric current; insulated gate field effect transistors; semiconductor device models; channel lengths; drain current; energy balance equation; energy distribution function; high energy electrons; hydrodynamic model; nMOSFET; substrate currents; transconductance; ultra-short-channel; ultrashort channels; Distributed computing; Distribution functions; Electrons; Equations; Hydrodynamics; MOSFET circuits; Predictive models; Robustness; Temperature distribution; Transconductance;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.229756
Filename
229756
Link To Document