Title :
Design and synthesis of self-checking VLSI circuits
Author :
Jha, Niraj K. ; Wang, Sying-Jyan
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
fDate :
6/1/1993 12:00:00 AM
Abstract :
Self-checking circuits can detect the presence of both transient and permanent faults. A self-checking circuit consists of a functional circuit that produces encoded output vectors and a checker that checks the output vectors. The checker has the ability to expose its own faults as well. The functional circuit can be either combinational or sequential. A self-checking system consists of an interconnection of self-checking circuits. The advantage of such a system is that errors can be caught as soon as they occur; thus, data contamination is prevented. Methods for the cost-effective design of combinational and sequential self-checking functional circuits and checkers are examined. The area overhead for all proposed design alternatives is studied in detail
Keywords :
VLSI; automatic testing; built-in self test; combinatorial circuits; error detection; integrated circuit testing; integrated logic circuits; logic design; logic testing; sequential circuits; TSC checkers; VLSI circuits; encoded output vectors; errors; permanent faults; self-checking circuit; transient faults; Circuit faults; Circuit synthesis; Circuits and systems; Contamination; Electrical fault detection; Fault detection; Integrated circuit interconnections; Programmable logic arrays; Very large scale integration; Voltage;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on