DocumentCode
930229
Title
Design and synthesis of self-checking VLSI circuits
Author
Jha, Niraj K. ; Wang, Sying-Jyan
Author_Institution
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Volume
12
Issue
6
fYear
1993
fDate
6/1/1993 12:00:00 AM
Firstpage
878
Lastpage
887
Abstract
Self-checking circuits can detect the presence of both transient and permanent faults. A self-checking circuit consists of a functional circuit that produces encoded output vectors and a checker that checks the output vectors. The checker has the ability to expose its own faults as well. The functional circuit can be either combinational or sequential. A self-checking system consists of an interconnection of self-checking circuits. The advantage of such a system is that errors can be caught as soon as they occur; thus, data contamination is prevented. Methods for the cost-effective design of combinational and sequential self-checking functional circuits and checkers are examined. The area overhead for all proposed design alternatives is studied in detail
Keywords
VLSI; automatic testing; built-in self test; combinatorial circuits; error detection; integrated circuit testing; integrated logic circuits; logic design; logic testing; sequential circuits; TSC checkers; VLSI circuits; encoded output vectors; errors; permanent faults; self-checking circuit; transient faults; Circuit faults; Circuit synthesis; Circuits and systems; Contamination; Electrical fault detection; Fault detection; Integrated circuit interconnections; Programmable logic arrays; Very large scale integration; Voltage;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.229762
Filename
229762
Link To Document