• DocumentCode
    930229
  • Title

    Design and synthesis of self-checking VLSI circuits

  • Author

    Jha, Niraj K. ; Wang, Sying-Jyan

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • Volume
    12
  • Issue
    6
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    878
  • Lastpage
    887
  • Abstract
    Self-checking circuits can detect the presence of both transient and permanent faults. A self-checking circuit consists of a functional circuit that produces encoded output vectors and a checker that checks the output vectors. The checker has the ability to expose its own faults as well. The functional circuit can be either combinational or sequential. A self-checking system consists of an interconnection of self-checking circuits. The advantage of such a system is that errors can be caught as soon as they occur; thus, data contamination is prevented. Methods for the cost-effective design of combinational and sequential self-checking functional circuits and checkers are examined. The area overhead for all proposed design alternatives is studied in detail
  • Keywords
    VLSI; automatic testing; built-in self test; combinatorial circuits; error detection; integrated circuit testing; integrated logic circuits; logic design; logic testing; sequential circuits; TSC checkers; VLSI circuits; encoded output vectors; errors; permanent faults; self-checking circuit; transient faults; Circuit faults; Circuit synthesis; Circuits and systems; Contamination; Electrical fault detection; Fault detection; Integrated circuit interconnections; Programmable logic arrays; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.229762
  • Filename
    229762