DocumentCode :
930392
Title :
Experimental microwave study of metal-to-metal point-contact diodes
Author :
Pyée, Maurice ; Uebersfeld, Jean ; Auvray, Jean ; Gastaud, Claude
Author_Institution :
Université de Paris VI, Paris, France
Volume :
62
Issue :
4
fYear :
1974
fDate :
4/1/1974 12:00:00 AM
Firstpage :
526
Lastpage :
529
Abstract :
New characteristics obtained with metal-insulator-metal (MIM) diodes are studied. These new characteristics are interpreted according to the tunneling process, and they are compared with the characteristics one can obtain with the IN23 diodes.
Keywords :
Capacitive sensors; Conductivity; Electric resistance; Grain size; Infrared detectors; Light emitting diodes; Metal-insulator structures; Optical films; Silver; Transistors;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1974.9462
Filename :
1451392
Link To Document :
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