Title :
Noise-factor measurement of millimetre-wave IMPATT diodes by the superregenerative principle
Author :
Stevance, J. ; Cachier, G.
Author_Institution :
Thomson-CSF, Laboratoire Central de Recherches, Orsay, France
Abstract :
The letter describes a new method for measuring the small signal noise factor of a millimetre IMPATT diode, which makes use of only an auxiliary millimetre source and some low-frequency electronics.
Keywords :
IMPATT diodes; electric noise measurement; solid-state microwave devices; millimetre wave IMPATT diodes; small signal noise factor; superregenerative principle;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19750452
