Title :
High-resolution measurement of polarization dependent loss
Author :
Nyman, Bruce M. ; Wolter, Gregory
Author_Institution :
AT&T Bell Lab., Holmdel, NJ, USA
fDate :
7/1/1993 12:00:00 AM
Abstract :
Polarization-dependent loss (PDL) is the dependence of insertion loss on the state of polarization (SOP) of the input light. Previous efforts to measure PDL of components had an uncertainty of more than 0.01 dB, primarily due to the PDL of the measurement equipment itself. A method that uses an erbium-doped-fiber depolarizer, resulting in a test set with an uncertainty of+or-0.001 dB, is presented.<>
Keywords :
measurement errors; optical losses; optical polarisers; optical resolving power; Er-doped fibre depolariser; erbium-doped-fiber depolarizer; high resolution measurement; input light; insertion loss; measurement equipment; measurement uncertainty; polarization dependent loss; state of polarization; Detectors; Erbium; Loss measurement; Optical fiber devices; Optical fiber polarization; Optical polarization; Optimized production technology; Page description languages; Polarization mode dispersion; Testing;
Journal_Title :
Photonics Technology Letters, IEEE
