DocumentCode :
931322
Title :
Optical Fiber and Preform Profiling Technology
Author :
Stewart, W.J.
Volume :
30
Issue :
10
fYear :
1982
Firstpage :
1439
Lastpage :
1454
Abstract :
A comprehensive review of state-of-tie-art optical fiber and preform index-profiling methods has been prepared. The advantages and disadvantages of the various approaches are discussed. Important parameters include measurement accuracy, resolution, simplicity, and the nondestructive features of some methods. Both optical and non-optical techniques have been treated. Resolution considerations probably favor the refracted near-field technique and this may be a decisive factor for the measurement of single-mode fibers. Simplicity of apparatus lies with near-field methods generally so that the bound near-field method is most often used for dimensioned measurements. Preform profiling is dominated by deflection function methods, usually accompanied by spatial filtering or focusing. Methods restricted to certain classes of fiber, such as the far-field approaches, are less attractive and, consequently, do not receive as much use.
Keywords :
Bandwidth; Length measurement; Optical attenuators; Optical fiber theory; Optical fibers; Optical refraction; Preforms; Refractive index; Shape; Wavelength measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1982.1131276
Filename :
1131276
Link To Document :
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