• DocumentCode
    931480
  • Title

    Vacuum Electronics: Status and Trends

  • Author

    Levush, Baruch ; Abe, David K. ; Calame, Jeffrey P. ; Danly, Bruce G. ; Nguyen, Khanh T. ; Dutkowski, E. Joseph ; Abrams, R.H. ; Parker, Robert K.

  • Author_Institution
    US Naval Res. Lab., Washington
  • Volume
    22
  • Issue
    9
  • fYear
    2007
  • Firstpage
    28
  • Lastpage
    34
  • Abstract
    The vast preponderance of US radar transmitters today use vacuum electronic amplifiers, spanning the spectrum from UHF to EHF. Enhancements to performance, reliability, and cost of ownership are being applied continuously to these systems: routine in-service life extensions mandate continuing vacuum electronics research and development to support system needs for the foreseeable future. In addition, exciting advances in vacuum electronics will provide dramatic improvements in millimeter-wave radar resolution, broadband low-noise power at microwave frequencies, compact high power sources operating at lower voltages, and life-cycle cost improvement. Recent progress in key enabling technologies, e.g., advanced device modeling and micro-fabrication, is expected to continue. This reviews the status and trends of vacuum electronics, with selected applications emphasizing recent advances in device performance in the microwave regime: multiple-beam klystrons (MBKs), microwave power modules (MPMs), and gyro-amplifiers in the millimeter-wave regime.
  • Keywords
    klystrons; millimetre wave amplifiers; modules; vacuum microelectronics; broadband low-noise power; gyro-amplifiers; life-cycle cost improvement; microwave power modules; millimeter-wave radar resolution; multiple-beam klystrons; vacuum electronic amplifiers; Costs; Microwave devices; Microwave frequencies; Millimeter wave radar; Power system modeling; Power system reliability; Research and development; Transmitters; Vacuum systems; Voltage;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.2007.4350256
  • Filename
    4350256