DocumentCode :
931563
Title :
Threshold decomposition of gray-scale morphology into binary morphology
Author :
Shih, F.Y. ; Mitchell, Owen Robert
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
11
Issue :
1
fYear :
1989
fDate :
1/1/1989 12:00:00 AM
Firstpage :
31
Lastpage :
42
Abstract :
Recently, a superposition property called threshold decomposition and another property called stacking were introduced and shown to apply successfully to gray-scale morphological operations. This property allows gray-scale signals to be decomposed into multiple binary signals. The signals are processed in parallel, and the results are combined to produce the desired gray-scale result. The authors present the threshold decomposition architecture and the stacking property that allows the implementation of this architecture. Gray-scale operations are decomposed into binary operations. This decomposition allows gray-scale morphological operations to be implemented using only logic gates in VLSI architectures that can significantly improve speed as well as give theoretical insight into the operations
Keywords :
VLSI; computerised picture processing; digital signal processing chips; parallel architectures; VLSI; binary morphology; computerised picture processing; gray-scale morphology; logic gates; multiple binary signals; parallel processing; stacking; threshold decomposition architecture; Computer architecture; Gray-scale; Image processing; Inspection; Logic gates; Morphological operations; Morphology; Shape; Stacking; Very large scale integration;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.23111
Filename :
23111
Link To Document :
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