Title :
Second breakdown: Hot spots or hot cylinders
Author :
Krishna, Surinder ; Gray, Peter
Author_Institution :
General Electric Company, Schenectady, N.Y.
Abstract :
An extension of the lateral thermal instability effects that give rise to second breakdown in transistors is presented. It is seen that regions where intrinsic ionization occurs are not localized "spots" but are present in the center of the emitter and along its entire length, giving rise to "hot cylinders."
Keywords :
Admittance; Artificial intelligence; Circuits; Electric breakdown; Equations; Frequency; Power system transients; Rotors; Sparse matrices; Synchronous machines;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1974.9589
