Title :
A 3.3-V 800-nVrms noise, gain-programmable CMOS microphone preamplifier design using yield modeling technique
Author :
Nicollini, Germano ; Guardiani, Carlo
Author_Institution :
SGS-Thomson Microelectron., Milano, Italy
fDate :
8/1/1993 12:00:00 AM
Abstract :
A 3.3-V CMOS low-noise gain-programmable microphone amplifier with a high-impedance balanced input is presented. The preamplifier allows gains from 20 to 35 dB to be set by software control in 1-dB steps with 0.05-dB accuracy. Typical measured VOS is 0.8 mV, VOS drift is 1 μV/C, input-referred p-weighted noise is 0.8 μV rms and total harmonic distortion (THD) is -70 dB. The active area is about 350 mils2, and power consumption is 1.7 mW at 3.3-V supply and 2.9 mW at 5-V supply. These results have been obtained through an intensive use of the yield modeling technique for yield-performance optimization during the design phase, and by applying a common-centroid cross-coupled strategy to the layout of all the ideally matched MOS transistors in the input stage
Keywords :
CMOS integrated circuits; audio-frequency amplifiers; gain control; linear integrated circuits; microphones; preamplifiers; 1.7 to 2.9 mW; 20 to 35 dB; 3.3 to 5 V; CMOS; THD; common-centroid cross-coupled strategy; gain-programmable; high-impedance balanced input; ideally matched MOS transistors; input stage; layout; microphone preamplifier design; power consumption; software control; total harmonic distortion; yield modeling; Circuits; Differential amplifiers; Impedance; Instruments; Low-noise amplifiers; Microphones; Preamplifiers; Resistors; Semiconductor device modeling; Telephony;
Journal_Title :
Solid-State Circuits, IEEE Journal of
