Title : 
Photon-induced charge transfer and surface emission
         
        
            Author : 
Barlett, Robert H. ; Fulk, Gerald A. ; Hofer, Walter W. ; Meeker, Donald J. ; Lee, Ronald S. ; Weingart, Richard C.
         
        
            Author_Institution : 
University of California, Livermore, Calif.
         
        
        
        
        
        
        
            Abstract : 
Experimental measurements have been made of photon-induced charge transfer between plane-parallel electrodes. X-rays from a pulsed X-ray source were directed at near-normal incidence onto plane-parallel electrodes, and the current which flowed between the electrodes during the X-ray pulse was measured. Quantities obtained include bulk charge transfer in several dielectric materials; forward and reverse electron emission from Al, Cu, and Au surfaces; and secondary electron emission coefficients for these metals and selected dielectrics. Measured values for charge transfer and surface emission are compared with calculations.
         
        
            Keywords : 
Charge measurement; Charge transfer; Current measurement; Dielectric materials; Dielectric measurements; Electrodes; Electron emission; Gold; Pulse measurements; X-rays;
         
        
        
            Journal_Title : 
Proceedings of the IEEE
         
        
        
        
        
            DOI : 
10.1109/PROC.1974.9598