DocumentCode :
931997
Title :
Compact model generation for on-chip transmission lines
Author :
Kim, Taeik ; Li, Xiaoyong ; Allstot, David J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Volume :
51
Issue :
3
fYear :
2004
fDate :
3/1/2004 12:00:00 AM
Firstpage :
459
Lastpage :
470
Abstract :
An approach for the fast and accurate generation of compact distributed circuit models for on-chip transmission lines on lossy silicon substrates is presented. Using a novel ABCD matrix partitioning procedure, accurate distributed circuit models are extracted from scattering parameters obtained from measurements and calibrated full-wave electromagnetic simulations for a small set of transmission-line geometries spanning ranges of design parameter values. A feedforward artificial neural network is trained using the extracted results, and applied to generate accurate compact models for arbitrary values within the bounds of the training ranges. Consequently, the model generation time is greatly reduced compared to conventional approaches by exploiting the interpolation capabilities of the neural network. The compact model generator is fully compatible with HSPICE and SPECTRE-RF and is easily incorporated into parasitic-aware RF circuit design and optimization tools.
Keywords :
S-parameters; circuit CAD; circuit optimisation; coplanar waveguides; distributed parameter networks; feedforward neural nets; integrated circuit modelling; matrix algebra; microstrip lines; radiofrequency integrated circuits; transmission lines; ABCD matrix partitioning; HSPICE; SPECTRE-RF; calibrated full-wave electromagnetic simulations; circuit optimization tools; compact distributed circuit model generation; coplanar waveguide; feedforward artificial neural network; lossy silicon substrates; microstrip line; neural network interpolation; on-chip transmission lines; parasitic-aware RF circuit design tools; transmission-line geometries; Artificial neural networks; Distributed parameter circuits; Electromagnetic modeling; Propagation losses; Scattering parameters; Silicon; Solid modeling; Transmission line matrix methods; Transmission line measurements; Transmission lines;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2003.822397
Filename :
1275593
Link To Document :
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