DocumentCode :
932335
Title :
Effective Conductivity and Microwave Reflectivity of Thin Metallic Films
Author :
Hansen, R.C. ; Pawlewicz, W.T.
Volume :
30
Issue :
11
fYear :
1982
Firstpage :
2064
Lastpage :
2066
Abstract :
Thin metallic films have reduced conductivity when thickness is not larger than electron mean free path, a phenomenon studied by Lord Thompson. Formulas given by Liao are valid for small thickness; a general formula is available for all ranges of film thickness. The result is in terms of an exponential integral which is easily computed, and is graphed. A simple and accurate formula for calculating microwave reflection from a thin metallic film is developed. The equivalent circuit has the film surface resistivity in shunt with 120 pi (or the substrate impedance). Examples of surface resistivity and reflection coefficient for a gold film are given graphically.
Keywords :
Conductive films; Conductivity; Electrons; Equivalent circuits; Gold; Optical films; Reflection; Reflectivity; Substrates; Surface impedance;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1982.1131380
Filename :
1131380
Link To Document :
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