• DocumentCode
    932636
  • Title

    Path-Based Buffer Insertion

  • Author

    Sze, C.N. ; Alpert, Charles J. ; Hu, Jiang ; Shi, Weiping

  • Author_Institution
    IBM Austin Research Laboratory, Austin
  • Volume
    26
  • Issue
    7
  • fYear
    2007
  • fDate
    7/1/2007 12:00:00 AM
  • Firstpage
    1346
  • Lastpage
    1355
  • Abstract
    Along with the progress of very-large-scale-integration technology, buffer insertion plays an increasingly critical role on affecting circuit design and performance. Traditional buffer insertion algorithms are mostly net based and therefore often result in suboptimal delay or unnecessary buffer expense due to the lack of global view. In this paper, we propose a novel path-based-buffer-insertion (PBBI) scheme which can overcome the weakness of the net-based approaches. We also discuss some potential difficulties of the PBBI approach and propose solutions to them. A fast estimation on buffered delay is employed to improve the solution quality. Gate sizing is also considered at the same time. Experimental results show that our method can efficiently reduce buffer/gate cost significantly (by 71% on average) when compared to traditional net-based approaches. To the best of our knowledge, this is the first work on path based buffer insertion and simultaneous gate sizing.
  • Keywords
    VLSI; buffer circuits; delay estimation; integrated circuit layout; buffered delay estimation; circuit design; gate sizing; integrated circuit layout; path-based buffer insertion; suboptimal delay; very-large-scale-integration; Circuit synthesis; Costs; Delay estimation; Design optimization; Heuristic algorithms; Integrated circuit interconnections; Libraries; Repeaters; Timing; Very large scale integration; Integrated circuit layout; performance optimization; physical design; repeaters; timing optimization; very large scale integration (VLSI);
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2006.888281
  • Filename
    4237243