• DocumentCode
    932816
  • Title

    High-Power Self-Pinch Diode Experiments for Radiographic Applications

  • Author

    Hinshelwood, David D. ; Allen, Raymond J. ; Commisso, Robert J. ; Cooperstein, Gerlad ; Huhman, Brett M. ; Mosher, David ; Murphy, D.P. ; Ottinger, Paul F. ; Schumer, Joseph W. ; Swanekamp, Stephen B. ; Stephanakis, Stavros J. ; Weber, Bruce V. ; Young, F

  • Author_Institution
    Naval Res. Lab., Washington
  • Volume
    35
  • Issue
    3
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    565
  • Lastpage
    572
  • Abstract
    We report here on self-magnetic-pinch diode experiments at voltages from 3.5 to 6 MV. In addition to electrical diagnostics, the diode is characterized as a radiation source by dose and spot-size measurement. As the operating voltage increases, we find that a given diode geometry tends to produce a smaller spot but suffers from the reduced impedance lifetime. Optimization involves increasing the cathode diameter and diode gap as the voltage increases. We find a good quantitative agreement with the Monte Carlo code integrated tiger series over the entire data set, assuming an effective electron incidence angle of 20deg. Over this range, we observe favorable dose and spot scaling of optimized diode performance with voltage. Our best results are roughly 200-rad at 1 m with an ~2-mm-diameter spot. These were obtained at diode parameters of roughly 6 MV, 150 kA, and 30-ns radiation full-width at half-maximum.
  • Keywords
    particle beams; pinch effect; plasma X-ray sources; plasma diodes; pulsed power technology; radiography; Monte Carlo code integrated tiger series; cathode diameter; diode gap; diode geometry; dose measurement; electrical diagnostics; electron incidence angle; impedance lifetime; operating voltage; radiation source; radiography; self-magnetic-pinch diode experiment; spot-size measurement; Cathodes; Diodes; Electrons; Geometry; Impedance; Laboratories; Particle beams; Physics; Radiography; Voltage; Electron beams; particle beams; pinched-beam diodes; pulsed power; radiography;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2007.895227
  • Filename
    4237261