DocumentCode
932816
Title
High-Power Self-Pinch Diode Experiments for Radiographic Applications
Author
Hinshelwood, David D. ; Allen, Raymond J. ; Commisso, Robert J. ; Cooperstein, Gerlad ; Huhman, Brett M. ; Mosher, David ; Murphy, D.P. ; Ottinger, Paul F. ; Schumer, Joseph W. ; Swanekamp, Stephen B. ; Stephanakis, Stavros J. ; Weber, Bruce V. ; Young, F
Author_Institution
Naval Res. Lab., Washington
Volume
35
Issue
3
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
565
Lastpage
572
Abstract
We report here on self-magnetic-pinch diode experiments at voltages from 3.5 to 6 MV. In addition to electrical diagnostics, the diode is characterized as a radiation source by dose and spot-size measurement. As the operating voltage increases, we find that a given diode geometry tends to produce a smaller spot but suffers from the reduced impedance lifetime. Optimization involves increasing the cathode diameter and diode gap as the voltage increases. We find a good quantitative agreement with the Monte Carlo code integrated tiger series over the entire data set, assuming an effective electron incidence angle of 20deg. Over this range, we observe favorable dose and spot scaling of optimized diode performance with voltage. Our best results are roughly 200-rad at 1 m with an ~2-mm-diameter spot. These were obtained at diode parameters of roughly 6 MV, 150 kA, and 30-ns radiation full-width at half-maximum.
Keywords
particle beams; pinch effect; plasma X-ray sources; plasma diodes; pulsed power technology; radiography; Monte Carlo code integrated tiger series; cathode diameter; diode gap; diode geometry; dose measurement; electrical diagnostics; electron incidence angle; impedance lifetime; operating voltage; radiation source; radiography; self-magnetic-pinch diode experiment; spot-size measurement; Cathodes; Diodes; Electrons; Geometry; Impedance; Laboratories; Particle beams; Physics; Radiography; Voltage; Electron beams; particle beams; pinched-beam diodes; pulsed power; radiography;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2007.895227
Filename
4237261
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