DocumentCode :
933009
Title :
Position dependence of the transient response of a position-sensitive detector under periodic pulsed light modulation
Author :
Narayanan, C. ; Buckman, A. Bruce ; Busch-Vishniac, I. ; Wang, Wanjun
Author_Institution :
Texas Univ., Austin, TX, USA
Volume :
40
Issue :
9
fYear :
1993
fDate :
9/1/1993 12:00:00 AM
Firstpage :
1688
Lastpage :
1694
Abstract :
A model based on sinusoidal steady-state analysis is developed for the position-sensitive detector (PSD), which is approximated as a distributed RC transmission line. This model is used to study the output response of the lateral effect PSD (i) when only one pulse-modulated light beam is incident and (ii) when two light beams of different wavelengths, with one beam modulated at a frequency f and the other beam modulated at a frequency 2f, are incident at the same time. The simulation shows, and experiments confirm, that the transient response of the PSD consists of a position-dependent dead time (time for the output current to sense the change in the induced photocurrent) and a position-independent exponential rise decay time. For the application of resolving the positions of two or more pulsed-modulated light spots, it is shown that there is a position-dependent upper limit on the usable modulation frequency. With the per-unit-length values chosen for the sheet resistance as R=315 Ω/mm and the junction capacitance as C=330 pF/mm, the modulation frequency limit is determined to be 20 kHz
Keywords :
optical sensors; photodetectors; position measurement; semiconductor device models; 20 kHz; distributed RC transmission line; lateral effect PSD; model; output response; periodic pulsed light modulation; position dependence; position-dependent dead time; position-independent exponential rise decay time; position-sensitive detector; simulation; sinusoidal steady-state analysis; transient response; Frequency modulation; Mechanical sensors; Optical modulation; Optical sensors; Position sensitive particle detectors; Pulse modulation; Steady-state; Structural beams; Transient response; Transmission lines;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.231576
Filename :
231576
Link To Document :
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