• DocumentCode
    933212
  • Title

    High-temperature remote thermometry using laser-induced fluorescence decay lifetime measurements of Y2O3:Eu and YAG:Tb thermographic phosphors

  • Author

    Alaruri, Sami D. ; Brewington, Andrew J. ; Thomas, Mark A. ; Miller, Jeff A.

  • Author_Institution
    Gen. Motors Corp., Indianapolis, IN, USA
  • Volume
    42
  • Issue
    3
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    735
  • Lastpage
    739
  • Abstract
    An Nd:YAG-laser-based remote sensing system for determining the surface temperature of substrates coated with thermographic phosphors has been developed. The fluorescence decay lifetime versus temperature measurements obtained for Y2O3:Eu (4.52% Ec) and YAG:Tb (5% Tb) over the temperature range 27°C-1095°C are presented. Both phosphors can be used for continuous temperature measurements over the range of approximately 550°C-1000°C. Stepwise regression analysis is used to calculate empirical relationships expressing temperature as a function of the measured fluorescence lifetimes for both phosphors beyond the onset temperature quenching point. The accuracy of the temperature measurements was estimated to be ±5%. The intensities of the 611-nm Y2O 3:Eu and the 544-nm YAG:Tb emission lines as a function of temperature are compared
  • Keywords
    europium; high-temperature techniques; laser beam applications; molecular fluorescence; phosphors; radiative lifetimes; spectral methods of temperature measurement; substrates; telemetering; terbium; yttrium compounds; 27 to 1095 degC; 544 nm; 611 nm; Y2O3:Eu; YAG:Tb thermographic phosphors; YAl5O12:Tb; empirical relationships; laser-induced fluorescence decay lifetime measurements; remote sensing; remote thermometry; substrates; surface temperature; turbine engine; Electromagnetic measurements; Fluorescence; Lifetime estimation; Neodymium; Phosphors; Regression analysis; Surface emitting lasers; Temperature measurement; Temperature sensors; Turbines;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.231599
  • Filename
    231599