DocumentCode
933324
Title
A new method for low-capacitance probing
Author
Carlosena, Alfonso ; Cabeza, Rafael ; Serrano, Luis
Author_Institution
Dept. of Autom., Electron. e Ingineria de Sistemas, Univ. Publica de Navarra, Spain
Volume
42
Issue
3
fYear
1993
fDate
6/1/1993 12:00:00 AM
Firstpage
775
Lastpage
778
Abstract
A method is suggested for cancelling the input capacitance of instruments and probes used in measurements. This approach is proposed as an alternative to conventional attenuating passive and active probes. The idea is demonstrated with a practical device that is able to nullify the parasitic capacitance to less than 2 pF without introducing signal attenuation
Keywords
capacitors; compensation; electric sensing devices; probes; 2 pF; active probes; low-capacitance probing; parasitic capacitance; passive probes; Actuators; Bridge circuits; Circuit simulation; Digital circuits; Hardware; Optical device fabrication; Piezoresistance; Silicon; Temperature distribution; Temperature sensors;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.231608
Filename
231608
Link To Document