DocumentCode :
933324
Title :
A new method for low-capacitance probing
Author :
Carlosena, Alfonso ; Cabeza, Rafael ; Serrano, Luis
Author_Institution :
Dept. of Autom., Electron. e Ingineria de Sistemas, Univ. Publica de Navarra, Spain
Volume :
42
Issue :
3
fYear :
1993
fDate :
6/1/1993 12:00:00 AM
Firstpage :
775
Lastpage :
778
Abstract :
A method is suggested for cancelling the input capacitance of instruments and probes used in measurements. This approach is proposed as an alternative to conventional attenuating passive and active probes. The idea is demonstrated with a practical device that is able to nullify the parasitic capacitance to less than 2 pF without introducing signal attenuation
Keywords :
capacitors; compensation; electric sensing devices; probes; 2 pF; active probes; low-capacitance probing; parasitic capacitance; passive probes; Actuators; Bridge circuits; Circuit simulation; Digital circuits; Hardware; Optical device fabrication; Piezoresistance; Silicon; Temperature distribution; Temperature sensors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.231608
Filename :
231608
Link To Document :
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