• DocumentCode
    933324
  • Title

    A new method for low-capacitance probing

  • Author

    Carlosena, Alfonso ; Cabeza, Rafael ; Serrano, Luis

  • Author_Institution
    Dept. of Autom., Electron. e Ingineria de Sistemas, Univ. Publica de Navarra, Spain
  • Volume
    42
  • Issue
    3
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    775
  • Lastpage
    778
  • Abstract
    A method is suggested for cancelling the input capacitance of instruments and probes used in measurements. This approach is proposed as an alternative to conventional attenuating passive and active probes. The idea is demonstrated with a practical device that is able to nullify the parasitic capacitance to less than 2 pF without introducing signal attenuation
  • Keywords
    capacitors; compensation; electric sensing devices; probes; 2 pF; active probes; low-capacitance probing; parasitic capacitance; passive probes; Actuators; Bridge circuits; Circuit simulation; Digital circuits; Hardware; Optical device fabrication; Piezoresistance; Silicon; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.231608
  • Filename
    231608