Title :
Performance of a two-junction array SIS-mixer operating around 345 GHz
Author :
Honingh, C.E. ; de Lange, G. ; Dierichs, M.M.T.M. ; Schaeffer, H.H.A. ; De Graauw, Th. ; Klapwijk, T.M.
Author_Institution :
Space Res. Organ. of the Netherlands, Groningen, Netherlands
fDate :
4/1/1993 12:00:00 AM
Abstract :
The authors have made a detailed study of the gain and noise of a SIS (superconductor-insulator-superconductor) heterodyne receiver at 345 GHz. An array of two Nb-Al2O3-Nb SIS junctions in series are used as the mixing element. The array is operated in a waveguide mount with a backshort and an E-plane tuner. The best receiver noise temperature achieved is 140 K DSB (double sideband). The embedding impedances were determined by fitting theory to the measured pumped curves. High-quality fits were obtained, providing the first detailed test of the Tucker-theory at frequencies above 300 GHz. The impedances found by this method are in very good agreement with impedances measured in a scale model at 3.3 GHz. From these embedding impedances, the gain and noise of the mixer were calculated over a full bias range using the Tucker theory in the three-port low-IF approximation. The measured dependence of mixer gain and noise on bias voltage, pump power and embedding impedance is in good agreement with theory. However the absolute values show discrepancies that appear to be independent of the bias parameters of the mixer
Keywords :
aluminium compounds; electric impedance; electron device noise; mixers (circuits); niobium; radio receivers; superconducting junction devices; superconducting microwave devices; 300 to 380 GHz; 345 GHz; E-plane tuner; EHF; MM-wave mixer; Nb-Al2O3-Nb; SIS-mixer; Tucker-theory; backshort; bias range; bias voltage; embedding impedances; gain; heterodyne receiver; noise temperature; pump power; superconductor-insulator-superconductor; three-port low-IF approximation; two-junction array; waveguide mount; Curve fitting; Frequency; Impedance measurement; Josephson junctions; Power measurement; Superconducting device noise; Superconducting devices; Temperature; Testing; Tuners;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on