• DocumentCode
    933821
  • Title

    An Automated Meta-Level Control Framework for Optimizing the Quality–Time Tradeoff of VLSI Algorithms

  • Author

    Aine, Sandip ; Chakrabarti, Partha P. ; Kumar, Rajeev

  • Author_Institution
    Indian Inst. of Technol., Kharagpur
  • Volume
    26
  • Issue
    11
  • fYear
    2007
  • Firstpage
    1992
  • Lastpage
    2008
  • Abstract
    We address the problem of optimizing the quality-time tradeoff of very large scale integration (VLSI) computer-aided design (CAD) algorithms working under various constrained environments. We present a unified meta-reasoning framework to automatically control the progress of iteratively improving CAD algorithms. The control framework uses profile knowledge about the quality-time relation of the algorithms used and generates a combined strategy for time allocation and parameter control that optimizes the expected tradeoff. We present specific formulations for handling single and multiple problems (both dependent and independent) under various constraints. We use the proposed strategies for adjusting the control parameters of standard simulated annealing and genetic algorithm based techniques used in VLSI optimization along with an appropriate time allocation suited for different constraint specifications. Application on several classical problems in the VLSI domain shows that significant improvement in quality-time tradeoff can be achieved.
  • Keywords
    VLSI; circuit CAD; genetic algorithms; simulated annealing; CAD algorithms; VLSI algorithms; appropriate time allocation; automated meta-level control framework; computer-aided design algorithms; genetic algorithm; parameter control; quality-time tradeoff; simulated annealing; time allocation; unified meta-reasoning framework; very large scale integration; Artificial intelligence; Automatic control; Constraint optimization; Design automation; Design optimization; Iterative algorithms; Optimization methods; Partitioning algorithms; Stochastic processes; Very large scale integration; Automated reasoning; meta-level control; quality–time tradeoff; stochastic optimization algorithms;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2007.906456
  • Filename
    4351995