Title :
CRISTA: A New Paradigm for Low-Power, Variation-Tolerant, and Adaptive Circuit Synthesis Using Critical Path Isolation
Author :
Ghosh, Swaroop ; Bhunia, Swarup ; Roy, Kaushik
Author_Institution :
Purdue Univ., Lafayette
Abstract :
Design considerations for robustness with respect to variations and low-power operations typically impose contradictory design requirements. Low-power design techniques such as voltage scaling, dual- , etc., can have a large negative impact on parametric yield. In this paper, we propose a novel paradigm for low-power variation-tolerant circuit design called critical path isolation for timing adaptiveness (CRISTA), which allows aggressive voltage scaling. The principal idea includes the following: 1) isolate and predict the set of possible paths that may become critical under process variations; 2) ensure that they are activated rarely; and 3) avoid possible delay failures in the critical paths by dynamically switching to two-cycle operation (assuming all standard operations are single cycle), when they are activated. This allows us to operate the circuit at reduced supply voltage while achieving the required yield. Simulation results on a set of benchmark circuits with Berkeley-predictive-technology-model [BPTM 70 nm: Berkeley predictive technology model] 70-nm devices that show an average of 60% improvement in power with small overhead in performance and 18% overhead in die area compared to conventional design. We also present two applications of the proposed methodology that include the following: 1) pipeline design for low power and 2) temperature-adaptive circuit design.
Keywords :
circuit CAD; logic CAD; low-power electronics; Berkeley-predictive-technology-model; CRISTA; adaptive circuit synthesis; critical path isolation; critical path isolation for timing adaptiveness; low-power circuit; pipeline design; temperature-adaptive circuit design; variation-tolerant circuit synthesis; variation-tolerant circuit synthesislogic circuits; voltage scaling; Circuit synthesis; Design optimization; Dynamic voltage scaling; Logic circuits; Logic design; Power dissipation; Predictive models; Robustness; Space exploration; Timing; Low power; process variation-tolerant design; supply voltage scaling; temperature-aware design;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2007.896305