DocumentCode :
933944
Title :
Nanomanipulation and fabrication by ion beam molding
Author :
Stevens, Ramsey ; Nguyen, Cattien ; Meyyappan, M.
Author_Institution :
Center for Nanotechnology, NASA Ames Res. Center, Moffett Field, CA, USA
Volume :
5
Issue :
3
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
255
Lastpage :
257
Abstract :
Nanoscale manipulation is a basic ability needed to realize many of the nanotechnology applications. We demonstrate an ion bean molding technique to shape the configuration of nanostructures. As an example, the native curvature of a carbon nanotube in an atomic force microscope tip and its undesirable angle with respect to the surface are removed by this technique to render the nanotube straight. The straightened nanotube is effectively used in a semiconductor profilometry application. The ion beam molding technique is also shown to be effective in creating a desirable net shape of nanotubes. As mechanical deformation determines electrical and other properties of nanotubes, such manipulation may be of use in nanodevice fabrication.
Keywords :
atomic force microscopy; carbon nanotubes; ion beam effects; nanotechnology; C; atomic force microscope; carbon nanotube; electrical property; ion beam molding technique; mechanical deformation; nanodevice fabrication; nanomanipulation; nanostructures; nanotechnology; semiconductor profilometry; Atomic force microscopy; Carbon nanotubes; Fabrication; Ion beams; Mechanical factors; NASA; Nanomaterials; Nanotechnology; Probes; Shape control; Carbon nanotube; ion beam molding; nanofabrication; nanomanipulation; nanomanufacturing;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2006.874056
Filename :
1632144
Link To Document :
بازگشت