DocumentCode
933944
Title
Nanomanipulation and fabrication by ion beam molding
Author
Stevens, Ramsey ; Nguyen, Cattien ; Meyyappan, M.
Author_Institution
Center for Nanotechnology, NASA Ames Res. Center, Moffett Field, CA, USA
Volume
5
Issue
3
fYear
2006
fDate
5/1/2006 12:00:00 AM
Firstpage
255
Lastpage
257
Abstract
Nanoscale manipulation is a basic ability needed to realize many of the nanotechnology applications. We demonstrate an ion bean molding technique to shape the configuration of nanostructures. As an example, the native curvature of a carbon nanotube in an atomic force microscope tip and its undesirable angle with respect to the surface are removed by this technique to render the nanotube straight. The straightened nanotube is effectively used in a semiconductor profilometry application. The ion beam molding technique is also shown to be effective in creating a desirable net shape of nanotubes. As mechanical deformation determines electrical and other properties of nanotubes, such manipulation may be of use in nanodevice fabrication.
Keywords
atomic force microscopy; carbon nanotubes; ion beam effects; nanotechnology; C; atomic force microscope; carbon nanotube; electrical property; ion beam molding technique; mechanical deformation; nanodevice fabrication; nanomanipulation; nanostructures; nanotechnology; semiconductor profilometry; Atomic force microscopy; Carbon nanotubes; Fabrication; Ion beams; Mechanical factors; NASA; Nanomaterials; Nanotechnology; Probes; Shape control; Carbon nanotube; ion beam molding; nanofabrication; nanomanipulation; nanomanufacturing;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2006.874056
Filename
1632144
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