• DocumentCode
    933944
  • Title

    Nanomanipulation and fabrication by ion beam molding

  • Author

    Stevens, Ramsey ; Nguyen, Cattien ; Meyyappan, M.

  • Author_Institution
    Center for Nanotechnology, NASA Ames Res. Center, Moffett Field, CA, USA
  • Volume
    5
  • Issue
    3
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    255
  • Lastpage
    257
  • Abstract
    Nanoscale manipulation is a basic ability needed to realize many of the nanotechnology applications. We demonstrate an ion bean molding technique to shape the configuration of nanostructures. As an example, the native curvature of a carbon nanotube in an atomic force microscope tip and its undesirable angle with respect to the surface are removed by this technique to render the nanotube straight. The straightened nanotube is effectively used in a semiconductor profilometry application. The ion beam molding technique is also shown to be effective in creating a desirable net shape of nanotubes. As mechanical deformation determines electrical and other properties of nanotubes, such manipulation may be of use in nanodevice fabrication.
  • Keywords
    atomic force microscopy; carbon nanotubes; ion beam effects; nanotechnology; C; atomic force microscope; carbon nanotube; electrical property; ion beam molding technique; mechanical deformation; nanodevice fabrication; nanomanipulation; nanostructures; nanotechnology; semiconductor profilometry; Atomic force microscopy; Carbon nanotubes; Fabrication; Ion beams; Mechanical factors; NASA; Nanomaterials; Nanotechnology; Probes; Shape control; Carbon nanotube; ion beam molding; nanofabrication; nanomanipulation; nanomanufacturing;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2006.874056
  • Filename
    1632144