DocumentCode
934330
Title
Validation of Geant4 Atomic Relaxation Against the NIST Physical Reference Data
Author
Guatelli, S. ; Mantero, A. ; Mascialino, B. ; Pia, M.G. ; Zampichelli, V.
Author_Institution
INFN, Genova
Volume
54
Issue
3
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
594
Lastpage
603
Abstract
The accuracy of the Geant4 component for the simulation of atomic relaxation has been evaluated against the experimental measurements of the NIST Standard Reference Data. The validation study concerns X-ray and Auger transition energies. The comparison of the simulated and experimental data with rigorous statistical methods demonstrates the excellent accuracy of the simulation of atomic de-excitation in Geant4.
Keywords
Auger effect; fluorescence; relaxation; standards; Auger transition energy; Geant4 atomic relaxation; NIST; X-ray transition energy; rigorous statistical methods; Atomic layer deposition; Atomic measurements; Electrons; Fluorescence; Measurement standards; Monte Carlo methods; NIST; Packaging; Physics; Statistical analysis; Auger electron; Geant4; Monte Carlo; fluorescence; simulation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2007.894814
Filename
4237413
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