• DocumentCode
    934353
  • Title

    A simple method of bipolar transistor field factor measurement

  • Author

    Bhat, K.N.

  • Author_Institution
    Indian Institute of Technology, Madras, India
  • Volume
    63
  • Issue
    5
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    828
  • Lastpage
    829
  • Abstract
    A method of bipolar transistor field factor measurement is described. The method is based on the measurement of the open-circuit voltage between the collector-base terminals when a forward bias voltage is applied across the emitter-base terminals. The theory and the experimental measurement on different transistor types are presented.
  • Keywords
    Bipolar transistors; Capacitance measurement; Circuits; Electrons; Germanium alloys; Impurities; Q measurement; Silicon alloys; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1975.9840
  • Filename
    1451770
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=934353