DocumentCode :
934423
Title :
On the Transient Analysis of Circuits Containing Multiple Diodes
Author :
Blakey, P.A. ; Froelich, R.K.
Volume :
31
Issue :
9
fYear :
1983
Firstpage :
781
Lastpage :
783
Abstract :
Multiple-diode circuits are increasingly being used for power combining at microwave frequencies. This paper presents a method for the transient analysis of such circuits. The method exploits the cold-capacitance-particle-current decomposition of semiconductor diodes and is simpler, more efficient, and more accurate than previously proposed approaches to the problem.
Keywords :
Computed tomography; Equations; Laboratories; Matrix decomposition; Microwave circuits; Microwave imaging; Notice of Violation; Remote sensing; Semiconductor diodes; Transient analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1983.1131593
Filename :
1131593
Link To Document :
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