DocumentCode
9345
Title
Approximation of the maximum frequency of operation for point-contact MIM diodes from DC current against voltage measurements
Author
Snyder, G. ; Rhoades, C. ; Hagmann, M.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
Volume
51
Issue
7
fYear
2015
fDate
4 2 2015
Firstpage
566
Lastpage
568
Abstract
Point-contact metal-insulator-metal (MIM) diodes have been used for detection and mixing at frequencies as high as 520 THz. In detection, the current responsivity (CR), defined as the change in the DC current caused by an incremental change in the high-frequency input power, depends on the dimensions of the diode and the test fixture. However, other researchers have shown that the intrinsic current responsivity (ICR) which sets an upper bound for the CR may be determined from DC current against voltage measurements. Additional calculations from DC measurements have been used to determine an upper bound for the maximum frequency of operation.
Keywords
MIM devices; semiconductor diodes; ICR; dc current; intrinsic current responsivity; point-contact MIM diodes; point-contact metal-insulator-metal diodes; test fixture; voltage measurements;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2014.4449
Filename
7073752
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