• DocumentCode
    9345
  • Title

    Approximation of the maximum frequency of operation for point-contact MIM diodes from DC current against voltage measurements

  • Author

    Snyder, G. ; Rhoades, C. ; Hagmann, M.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
  • Volume
    51
  • Issue
    7
  • fYear
    2015
  • fDate
    4 2 2015
  • Firstpage
    566
  • Lastpage
    568
  • Abstract
    Point-contact metal-insulator-metal (MIM) diodes have been used for detection and mixing at frequencies as high as 520 THz. In detection, the current responsivity (CR), defined as the change in the DC current caused by an incremental change in the high-frequency input power, depends on the dimensions of the diode and the test fixture. However, other researchers have shown that the intrinsic current responsivity (ICR) which sets an upper bound for the CR may be determined from DC current against voltage measurements. Additional calculations from DC measurements have been used to determine an upper bound for the maximum frequency of operation.
  • Keywords
    MIM devices; semiconductor diodes; ICR; dc current; intrinsic current responsivity; point-contact MIM diodes; point-contact metal-insulator-metal diodes; test fixture; voltage measurements;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.4449
  • Filename
    7073752