DocumentCode :
934548
Title :
Scintillation Light, Ionization Yield and Scintillation Decay Times in High Pressure Xenon and Xenon Methane
Author :
Pushkin, K.N. ; Akimov, D.Y. ; Burenkov, A.A. ; Dmitrenko, V.V. ; Kovalenko, A.G. ; Lebedenko, V.N. ; Kuznetsov, I.S. ; Stekhanov, V.N. ; Tezuka, C. ; Ulin, S.E. ; Uteshev, Z.M. ; Vlasik, K.F.
Author_Institution :
State Univ., Moscow
Volume :
54
Issue :
3
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
744
Lastpage :
750
Abstract :
Scintillation light, ionization yield and scintillation decay times have been measured in xenon and in its mixture with a 0.05% concentration of methane as a function of the reduced electric field (E/N)-the ratio of the electric field strength to the number density of gas-at a pressure of 21 atm. The measurements of scintillation decay times in the xenon-methane mixture have been made for the first time as a function of the reduced electric field (E/N). An ionization chamber has been constructed to simultaneously measure electrons and photons from a 239Pu source, which is placed in the center of a cathode in the chamber. The main peculiarity of the chamber is a movable cathode to measure scintillation light and ionization yield at various distances from the anode and monitor the purity of the investigated gas. It has been observed that both scintillation light and ionization yield decrease when methane is added into the xenon gas. Scintillation decay times in the xenon-methane mixture are observed to be longer than in the pure xenon when the electric field strength increases.
Keywords :
electron detection; ionisation chambers; solid scintillation detectors; high pressure xenon; ionization chamber; ionization yield; movable cathode; scintillation decay times; scintillation light; xenon-methane mixture; Anodes; Cathodes; Density measurement; Electric variables measurement; Electrons; Ionization chambers; Monitoring; Pressure measurement; Time measurement; Xenon; High pressure xenon detectors; ionization yield; scintillation light; time protection chamber; xenon-methane mixture;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2007.894815
Filename :
4237434
Link To Document :
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