Spectral testing of circuit realisations based on linearisations

Fault-detection techniques using data compression have evolved during the last few years. Two of these involve syndrome testing and spectral-coefficient testing, which are closely related to each other. It is shown in the paper that, for combinational circuits designed using a linearisation method proposed by a number of authors, it is always possible to cover all single stuck-at faults using a linearisation signature that consists of m + 1 spectral coefficients (m < n, the number of input variables). It is also shown that the linearisation signature provides some coverage against multiple faults in the circuit.