• DocumentCode
    934762
  • Title

    Applications of electrical noise

  • Author

    Gupta, Madhu-Sudan

  • Author_Institution
    Massachusetts Institute of Technology, Cambridge, Mass.
  • Volume
    63
  • Issue
    7
  • fYear
    1975
  • fDate
    7/1/1975 12:00:00 AM
  • Firstpage
    996
  • Lastpage
    1010
  • Abstract
    The omnipresent noise in electronic circuits and devices is generally considered undesirable. This paper describes some of the applications to which it has been put. Short descriptions of a wide variety of applications are given together with references for further details. The applications fall in four categories: applications in which noise is used as a broad-band random signal; measurements in which the random noise is used as a test signal; measurements in which noise is used as a probe into microscopic phenomena; and the applications where noise is a conceptual or theoretical tool. Many examples of applications in each of these categories are given. Some of the applications included are only of historical interest now, and a few are, as yet, only proposals.
  • Keywords
    Circuit noise; Diseases; Electronic circuits; Fluctuations; Helium; Microscopy; Noise measurement; Noise reduction; Pollution measurement; Probes;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1975.9877
  • Filename
    1451807