DocumentCode :
934974
Title :
Scanning the issue
Author :
Hoagland, A.S. ; Rice, R.
Author_Institution :
IBM Research Center, New York, N. Y.
Volume :
63
Issue :
8
fYear :
1975
Firstpage :
1092
Lastpage :
1095
Abstract :
Provides an overview of the technical articles and features presented in this issue.
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1975.9900
Filename :
1451830
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=934974
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