Title :
Guest Editors´ Introduction: Attacking Functional Verification through Hybrid Techniques
Author :
Bhadra, Jayanta ; Abadir, Magdy S. ; Wang, Li.-C.
Author_Institution :
Freescale Semiconductor
Abstract :
Hybrid techniques are effective for exploring interesting corner cases, coverage holes, invariant variations, and so forth, in the general area of directed functional validation. However, despite the emergence of several effective hybrid validation techniques, several questions still remain. The five articles in this special issue help explain some of the different facets of this area.
Keywords :
Automatic testing; Computer bugs; Costs; Debugging; Design engineering; Formal verification; Power generation; Protocols; Scalability; Time to market; formal verification; functional validation; hybrid technique; simulation;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.45