DocumentCode :
935068
Title :
Guest Editors´ Introduction: Attacking Functional Verification through Hybrid Techniques
Author :
Bhadra, Jayanta ; Abadir, Magdy S. ; Wang, Li.-C.
Author_Institution :
Freescale Semiconductor
Volume :
24
Issue :
2
fYear :
2007
Firstpage :
110
Lastpage :
111
Abstract :
Hybrid techniques are effective for exploring interesting corner cases, coverage holes, invariant variations, and so forth, in the general area of directed functional validation. However, despite the emergence of several effective hybrid validation techniques, several questions still remain. The five articles in this special issue help explain some of the different facets of this area.
Keywords :
Automatic testing; Computer bugs; Costs; Debugging; Design engineering; Formal verification; Power generation; Protocols; Scalability; Time to market; formal verification; functional validation; hybrid technique; simulation;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2007.45
Filename :
4237487
Link To Document :
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