• DocumentCode
    935135
  • Title

    A Ka-Band GaAs Monolithic Phase Shifter

  • Author

    Sokolov, Vladimir ; Geddes, John J. ; Contolatis, A. ; Bauhahn, Paul E. ; Chao, Chente

  • Volume
    31
  • Issue
    12
  • fYear
    1983
  • Firstpage
    1077
  • Lastpage
    1083
  • Abstract
    The design and performance of a GaAs monolithic 1800 one-bit switched line phase shifter test circuit for Ka-band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitic in the switching FET´s. Over the 27.5-30 GHz band, typical measured differential insertion phase is within 10-20° of the ideal time delay characteristic. Over the same band, the insertion loss for the SAG phase shifter is about 2.5-3 dB per bit. The SAG fabrication technique holds promise in reducing phase shifter insertion loss to about 1.5 dB/bit for 30-GHz operation.
  • Keywords
    Circuit testing; Delay effects; FETs; Fabrication; Gallium arsenide; Insertion loss; Phase measurement; Phase shifters; Switching circuits; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1983.1131665
  • Filename
    1131665