DocumentCode
935225
Title
A textbook with two target audiences [review of VLSI Test Principles and Architecture by Laung-Terng Wang et al.; 2006]
Author
Davidson, S.
Author_Institution
Sun Microsystems
Volume
24
Issue
2
fYear
2007
Firstpage
198
Lastpage
199
Abstract
This is a review of VLSI Test Principles and Architectures (edited by Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen), which is partly a textbook and partly a collection of survey articles on testing by top experts. The book´s strengths include the practical aspects discussed, the good examples presented, and the depth of many of its chapters. The weaknesses include a lack of consistency of target audience across chapters and a lack of cohesiveness. Nearly everyone will get something out of this book, but prospective purchasers should review the topics of interest to see if the level is right for them.
Keywords
Automatic test pattern generation; Book reviews; Built-in self-test; Circuit faults; Circuit testing; Controllability; Logic testing; Sections; Sun; Very large scale integration; DFT; VLSI; architectures; test principles;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.31
Filename
4237502
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