Abstract :
This is a review of VLSI Test Principles and Architectures (edited by Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen), which is partly a textbook and partly a collection of survey articles on testing by top experts. The book´s strengths include the practical aspects discussed, the good examples presented, and the depth of many of its chapters. The weaknesses include a lack of consistency of target audience across chapters and a lack of cohesiveness. Nearly everyone will get something out of this book, but prospective purchasers should review the topics of interest to see if the level is right for them.
