• DocumentCode
    935310
  • Title

    Effects of redundancy management on reliability modeling

  • Author

    Walker, Bruce K. ; Wereley, Norman M. ; Luppold, Robert H. ; Gai, Eliezer

  • Author_Institution
    Dept. of Aerosp. Eng. & Eng. Mech., Cincinnati Univ., OH, USA
  • Volume
    38
  • Issue
    4
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    475
  • Lastpage
    482
  • Abstract
    Two methods are investigated for incorporating the effects of fault detection and isolation (FDI) decision errors and redundancy management (RM) policy into reliability models for a simple single-component-dual-redundant system. These two methods are combinatorial analysis and Markov chain modeling. Reliability analysts have traditionally chosen the classical combinatorial approach. However, the authors show that the existence of time-ordered event sequences resulting from the interaction of FDI decision errors with the RM policy considerably complicates the construction of the combinatorial model. An error analysis illustrates that a simplified combinatorial model, which ignores these time-ordered event sequences, inaccurately predicts the system reliability. The Markov modeling technique is an excellent alternative to the combinatorial approach because it easily and accurately accounts for time-ordered event sequences such as those present in fault-tolerant systems
  • Keywords
    Markov processes; combinatorial mathematics; error analysis; redundancy; reliability theory; FDI decision errors; Markov chain modeling; combinatorial analysis; error analysis; fault detection and isolation; fault-tolerant systems; redundancy management; reliability models; single-component-dual-redundant system; time-ordered event sequences; Built-in self-test; Error analysis; Fault detection; Fault tolerant systems; Laboratories; Logic; Predictive models; Redundancy; Reliability; Technology management;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.46468
  • Filename
    46468