DocumentCode

936642

Title

Reasoning About Fault Diagnosis with LES

Author

Laffey, Thomas J. ; Perkins, Walton A. ; Nguyen, Tin A.

Author_Institution

Lockheed Palo Alto Research Laboratory, 092-10 B/257, 3251 Hanover St., Palo Alto, CA 94304.

Volume

1

Issue

1

fYear

1986

fDate

4/1/1986 12:00:00 AM

Firstpage

13

Lastpage

20

Keywords

Artificial intelligence; Baseband; Circuit faults; Expert systems; Fault diagnosis; Laboratories; Printed circuits;

fLanguage

English

Journal_Title

IEEE Expert

Publisher

ieee

ISSN

0885-9000

Type

jour

DOI

10.1109/MEX.1986.5006493

Filename

5006493