DocumentCode
936678
Title
A new perspective on the origin of prebreakdown electron emission processes
Author
Latham, R.V.
Author_Institution
Aston Univ., Birmingham, UK
Volume
23
Issue
1
fYear
1988
fDate
2/1/1988 12:00:00 AM
Firstpage
9
Lastpage
16
Abstract
An account is presented of two probe techniques that have been used to locate and study the physical properties of individual electron emission sites on broad-area high-voltage electrodes. Details are given of the typical microgeometry and elemental composition of the particulate structures responsible for the emission, and the electron spectral and projection image characteristics of the emission process. These findings are discussed in terms of a recently proposed field-induced hot-electron emission (FIHEE) mechanism that involves a composite metal-insulator emission regime. Finally, the technological implications of these recent developments are considered.
Keywords
electric breakdown; electron field emission; electron probes; broad-area high-voltage electrodes; composite metal-insulator emission regime; electron emission sites; electron spectral characteristics; elemental composition; field-induced hot-electron emission; microgeometry; particulate structures; prebreakdown electron emission; probe techniques; projection image characteristics; Anodes; Electrodes; Electron emission; Geometry; Insulation; Metal-insulator structures; Probes; Scanning electron microscopy; Surface topography; Vacuum technology;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/14.2325
Filename
2325
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