• DocumentCode
    936678
  • Title

    A new perspective on the origin of prebreakdown electron emission processes

  • Author

    Latham, R.V.

  • Author_Institution
    Aston Univ., Birmingham, UK
  • Volume
    23
  • Issue
    1
  • fYear
    1988
  • fDate
    2/1/1988 12:00:00 AM
  • Firstpage
    9
  • Lastpage
    16
  • Abstract
    An account is presented of two probe techniques that have been used to locate and study the physical properties of individual electron emission sites on broad-area high-voltage electrodes. Details are given of the typical microgeometry and elemental composition of the particulate structures responsible for the emission, and the electron spectral and projection image characteristics of the emission process. These findings are discussed in terms of a recently proposed field-induced hot-electron emission (FIHEE) mechanism that involves a composite metal-insulator emission regime. Finally, the technological implications of these recent developments are considered.
  • Keywords
    electric breakdown; electron field emission; electron probes; broad-area high-voltage electrodes; composite metal-insulator emission regime; electron emission sites; electron spectral characteristics; elemental composition; field-induced hot-electron emission; microgeometry; particulate structures; prebreakdown electron emission; probe techniques; projection image characteristics; Anodes; Electrodes; Electron emission; Geometry; Insulation; Metal-insulator structures; Probes; Scanning electron microscopy; Surface topography; Vacuum technology;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.2325
  • Filename
    2325