DocumentCode :
936678
Title :
A new perspective on the origin of prebreakdown electron emission processes
Author :
Latham, R.V.
Author_Institution :
Aston Univ., Birmingham, UK
Volume :
23
Issue :
1
fYear :
1988
fDate :
2/1/1988 12:00:00 AM
Firstpage :
9
Lastpage :
16
Abstract :
An account is presented of two probe techniques that have been used to locate and study the physical properties of individual electron emission sites on broad-area high-voltage electrodes. Details are given of the typical microgeometry and elemental composition of the particulate structures responsible for the emission, and the electron spectral and projection image characteristics of the emission process. These findings are discussed in terms of a recently proposed field-induced hot-electron emission (FIHEE) mechanism that involves a composite metal-insulator emission regime. Finally, the technological implications of these recent developments are considered.
Keywords :
electric breakdown; electron field emission; electron probes; broad-area high-voltage electrodes; composite metal-insulator emission regime; electron emission sites; electron spectral characteristics; elemental composition; field-induced hot-electron emission; microgeometry; particulate structures; prebreakdown electron emission; probe techniques; projection image characteristics; Anodes; Electrodes; Electron emission; Geometry; Insulation; Metal-insulator structures; Probes; Scanning electron microscopy; Surface topography; Vacuum technology;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/14.2325
Filename :
2325
Link To Document :
بازگشت