Title :
Room temperature performance of submicron bismuth Hall probes
Author :
Petit, D. ; Atkinson, D. ; Johnston, S. ; Wood, D. ; Cowburn, R.P.
Author_Institution :
Dept. of Phys., Univ. of Durham, UK
fDate :
3/3/2004 12:00:00 AM
Abstract :
We report on the room temperature performance of bismuth Hall probes fabricated using focused ion beam milling. The sensitivity of the devices has been studied for a wide range of sizes (50 nm-10 μm) and for three film thicknesses: 29, 78 and 152 nm. It was found that the sensitivity of such probes is not limited by Johnson noise and is strongly dependent on both the thickness of the film and the dimensions of the device. The results are discussed in terms of practical applications to Scanning Hall Probe Microscopy.
Keywords :
Hall effect devices; bismuth; magnetic sensors; magnetic variables measurement; milling; probes; scanning probe microscopy; sensitivity; thermal noise; 152 nm; 29 nm; 293 to 298 K; 50 nm to 10 micron; 78 nm; Bi; Johnson noise; focused ion beam milling; room temperature performance; scanning Hall probe microscopy; sensitivity; submicron bismuth Hall probes;
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
DOI :
10.1049/ip-smt:20040167
