Single-fault diagnosis of nonlinear resistive networks

The paper presents a simulation-aftertest algorithm for fault diagnosis of a nonlinear resistive network. Fault diagnosis equations are expressed in terms of a modified nodal description of the test network. The linear programming technique is used to obtain different solutions of these equations. It is assumed that the maximum number of simultaneous faults in the circuit is bounded. This enables us to apply logical analysis to these solutions and to obtain the diagnosis problem solution. In addition, theoretical conditions under which a faulty element can be located uniquely are discussed. Several numerical examples are given to illustrate the implementation of these algorithms.