Title :
Separation of Magnetic Losses in UHF Ferrites
Author :
Brastins, A. ; Williams, E. M.
Author_Institution :
Carnegie Institute of Technology, Pittsburgh, Pa.
Keywords :
Circuit testing; Diodes; Ferrites; Magnetic fields; Magnetic losses; Magnetic materials; Magnetic separation; Packaging; Performance evaluation; UHF measurements;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1961.5006570
