Parametric modeling of integrated circuit interconnections

Author

Siomacco, Edward M. ; Tummala, Murali

Author_Institution

Dept. of Electr. & Comput. Eng., Naval Postgraduate Sch., Monterey, CA, USA

Volume

39

Issue

6

fYear

1992

fDate

6/1/1992 12:00:00 AM

Firstpage

377

Lastpage

382

Abstract

A parametric approach to the modeling and characterization of high frequency losses and dispersive propagation on integrated-circuit (IC) interconnections is presented. An autoregressive moving-average (ARMA) model based on a lumped equivalent circuit of a lossy microstrip transmission line is proposed. Model parameters are estimated from on-wafer time-domain measurements using a weighted least squares (WLS) algorithm and an Elmore delay approximation technique. It is shown that the effective microstrip permittivity can be evaluated from the estimated ARMA model parameters. Experiment results are compared with computer simulations of the lumped equivalent circuit and ARMA parametric models

Keywords

digital integrated circuits; equivalent circuits; integrated circuit technology; parameter estimation; semiconductor device models; strip lines; ARMA parametric models; Elmore delay approximation; IC interconnect; MMIC; WLS algorithm; autoregressive moving-average; dispersive propagation; effective microstrip permittivity; high frequency losses; high speed digital circuits; integrated circuit interconnections; lossy microstrip transmission line; lumped equivalent circuit; model parameters; on-wafer time-domain measurements; weighted least squares; Delay estimation; Equivalent circuits; Frequency; Integrated circuit interconnections; Integrated circuit modeling; Least squares approximation; Microstrip; Parameter estimation; Parametric statistics; Propagation losses;

fLanguage

English

Journal_Title

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on

Publisher

ieee

ISSN

1057-7130

Type

jour

DOI

10.1109/82.145295

Filename

145295