Title :
All optical XOR logic gates: technologies and experiment demonstrations
Author :
Zhang, Min ; Wang, Ling ; Ye, Peida
Author_Institution :
Beijing Univ. of Posts & Telecommun., China
fDate :
5/1/2005 12:00:00 AM
Abstract :
This article reviews the current status and technologies of all-optical XOR gates. Various schemes with semiconductor optical amplifiers, particularly those associated with interferometric structures, are discussed and compared. Finally, the applications of all-optical XOR gates to emerging networks are explored, and the future direction is outlined.
Keywords :
light interferometry; logic gates; optical fibre amplifiers; optical logic; semiconductor optical amplifiers; all optical XOR logic gate; interferometric structure; semiconductor optical amplifier; Boolean functions; Logic gates; Optical beams; Optical fiber communication; Optical polarization; Optical signal processing; Probes; Semiconductor optical amplifiers; Testing; Ultrafast optics;
Journal_Title :
Communications Magazine, IEEE
DOI :
10.1109/MCOM.2005.1453421
