Title :
Characteristics of Silicon Junction Diodes as Precision Voltage Reference Devices
Author_Institution :
Dept. of Physics, Univ. of Rochester, N. Y.
fDate :
6/1/1957 12:00:00 AM
Keywords :
Batteries; Conductivity; Diodes; Electronic equipment; Helium; Instruments; Low voltage; Silicon; Subspace constraints; Temperature measurement;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1957.5006685
