Title :
The Noise Problem in a Coincident-Current Core Memory
Author_Institution :
Lincoln Lab., M.I.T.. Lexington, Mass.
fDate :
6/1/1957 12:00:00 AM
Keywords :
Circuit testing; Driver circuits; Magnetic cores; Magnetic noise; Packaging; Pulse amplifiers; Registers; Switches; Tellurium; Transformer cores;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1957.5006693
