Title :
Transistorized-Core Memory
Author :
McMahon, Robert E.
Author_Institution :
Lincoln Lab., M.I.T., Lexington, Mass.
fDate :
6/1/1957 12:00:00 AM
Keywords :
Art; Breakdown voltage; Contracts; Cutoff frequency; Design engineering; Instruments; Low voltage; Manufacturing; Power dissipation; Power engineering and energy;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1957.5006694
