DocumentCode :
938587
Title :
Medium term aging characterization of enamelled for high frequency applications
Author :
Guastavino, F. ; Coletti, G. ; Torello, E.
Author_Institution :
Electr. Eng. Dept., Genoa Univ., Italy
Volume :
12
Issue :
3
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
524
Lastpage :
529
Abstract :
This work is related to a medium term research program which aims at studying the behaviour of twisted pair specimens of enamelled copper wires subjected to high frequency sinusoidal voltage waveforms which are used in some advanced types of electrical machines. High frequency voltages due to, for instance, converter operation are not considered in this paper. The following test conditions were adopted: different voltage amplitudes up to 2 kV, selected voltage frequencies up to 5 kHz and test temperatures up to 200 °C. The experimental work aims at defining reference-testing procedures and at studying the aging process of enamelled wires which are usually employed in random windings of electrical machines. As final result, a phenomenological model of the aging process, acting in the considered insulation system, is obtained and it is accurately defined on the grounds of the output data. The type of test method adopted and the type of data processing appear worthy to be used in order to characterize enamelled wires in terms of thermoelectrical degradation processes in presence of partial discharges.
Keywords :
ageing; copper; electric machines; insulated wires; insulator testing; machine windings; partial discharges; aging process; data processing; electrical machines; enamelled copper wires; high frequency voltage; insulation system; partial discharge; phenomenological model; reference-testing procedure; thermoelectrical degradation; Aging; Copper; Data processing; Frequency conversion; Insulation; Machine windings; Temperature; Testing; Voltage; Wires;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2005.1453457
Filename :
1453457
Link To Document :
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