Title :
Residual Reactance Bridge
Author :
Diamond, J.M. ; Polushkin, A.
Author_Institution :
United Transformer Co., New York, N.Y.
Keywords :
Bridge circuits; Capacitance; Delay; Electrical resistance measurement; Frequency; Inductance; Instruments; Measurement standards; Resistors; Testing;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1957.5006734
