Title :
Data Handling for a Reliability Test Program
Author :
Walter, V.W. ; Bien, F.I.
Author_Institution :
Inland Testing Labs., Morton Grove, Ill.
fDate :
3/1/1958 12:00:00 AM
Keywords :
Calibration; Data analysis; Data handling; Diodes; Frequency measurement; Instruments; Maintenance; Performance evaluation; System testing; Time measurement;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1958.5006750