Title :
Multiple fault simulation in linear active circuits
Author_Institution :
University of California, Department of Electrical Sciences and Engineering, Los Angeles, USA
Abstract :
An efficient algorithm is described for simulating the effects of multiple faults in linear active circuits. The process is also applicable to the multiparameter large-change sensitivity analysis of linear circuits. It is based on a generalisation of the branch-at-a-time circuit-analysis algorithm of Kron and Branin.
Keywords :
active networks; linear network analysis; sensitivity analysis; simulation; branch at a time circuit analysis; linear active circuits; multiparameter large change sensitivity analysis; multiple fault simulation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19760355
